Transistor performance can be measured across changes in patterning, lithography, etch, deposition, and other process integration effects. Designers can generate transistor IV curves and perform automatic device parameter extraction from those curves. The new Device Analysis capability can extract electrical characteristics of a transistor and explore process variability on device operation, all directly within SEMulator3D. The new Device Analysis capability enables seamless understanding of how process changes, process variability, and integration schemes directly impact transistor device performance. With added features, performance improvements, and a new Device Analysis capability, SEMulator3D 7.0 addresses both process and device simulation while lowering the barriers to advanced semiconductor technology development. Coventor SEMulator3D 7.0 – the newest version of its semiconductor virtual fabrication platform.
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